Affiliated Forum III

updated on 7 September 2026

AF.I – From Discovery to Translation: Integrating Fast-Track Innovation, Advanced Delivery Systems, and Data-Driven Precision Nanomedicine
AF.II – Advanced Materials for Space: Research Results, Industrial Impact and Future Directions
AF.III – Application Workshop on Digital and 3D Confocal Microscopy and Laser Probe Profilometry with Nanometric Resolution
AF.IV – Forum PNRR Sapienza
AF.V – Cultural Heritage

FRESCOES ROOM

AF.III Application Workshop on Digital and 3D Confocal Microscopy and Laser Probe Profilometry with Nanometric Resolution *14 september*
Organised with

During the application workshop, advanced solutions for surface and three-dimensional characterization of any material at macro, micro, and nano scale will be presented. There will be practical demonstrations of ultra-high-resolution inspection and imaging, 2D/3D metrological analysis, and roughness measurement. Participants will be able to bring their own samples and analyze them together with Simitecno specialists, directly evaluating the possible applications of the presented technologies. For further information and registration: CLICK ON THIS LINK


11:00 – 17:00 (lunch break 13:00 – 14:00)
PROGRAMME
11:00 – 12:00				Introduction and overview of the technologies
12:00 – 13:00				Live demonstrations
13:00 – 14:00				Lunch break
14:00 – 17:00				Hands-on session — analysis of participants' samples


BRING YOUR OWN SAMPLE The afternoon session is dedicated to samples brought by participants. Places are limited: indicate the type of material and the measurement of interest when registering.
TECHNOLOGIES ON SITE
Hirox 3D Digital Microscope: microscope for 360° imaging without sample manipulation, enabling high-resolution multiscale 2D/3D scanning and measurements, with magnification up to 10,000×. NPS Confocal Profilometer: white-light chromatic confocal profilometer for high-resolution, non-contact scanning of surface profiles, with Z-axis resolution down to 76 nm. It can analyze virtually any surface, including reflective, mirrored, and transparent surfaces, and enables certified surface roughness measurements. Mitaka Laser Profilometer: high-precision laser profilometer with 1 nm Z-axis resolution. The 0.5 μm laser spot, combined with high-precision motorized XY axes, enables real-time 3D profile measurement of virtually any type of surface, avoiding optical collimation errors associated with focal planes.


CALL TO ACTION
Information and registration at this forum (handled by Simitecno) NanoInnovation registration is mandatorily required for access to the venue.